13 results on '"Collins, R."'
Search Results
2. Method to compensate for fluctuations in optical power delivered to a near-field scanning optical microscope
3. Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films
4. Multichannel ellipsometer for real time spectroscopy of thin film deposition from 1.5 to 6.5 eV
5. Design and validation of guarded hot plate instruments for measuring heat flow between evacuated plane-parallel glass surfaces
6. Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth
7. Simultaneous real‐time spectroscopic ellipsometry and reflectance for monitoring thin‐film preparation
8. Spectroscopic ellipsometry on the millisecond time scale for real‐time investigations of thin‐film and surface phenomena
9. Waveform analysis with optical multichannel detectors: Applications for rapid‐scan spectroscopic ellipsometry
10. Automatic rotating element ellipsometers: Calibration, operation, and real-time applications
11. Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth
12. Measurement of charge distribution in electrets.
13. Design of a guarded electrode
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.