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1. Scanning noise microscopy

5. ‘‘Tracking’’ tunneling microscopy.

6. Focused ion beam milling monitored by an additional electrode.

7. Variable-temperature lightwave-driven scanning tunneling microscope with a compact, turn-key terahertz source.

8. Three dimensional tracing of a charged particle by electrostatic detection.

9. Electrometer with sub-attoampere current load.

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