1. Microstructural investigation of Ti–Si–N hard coatings
- Author
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Tang, Fengzai, Gault, Baptiste, Ringer, Simon P., Martin, Phil, Bendavid, Avi, and Cairney, Julie M.
- Subjects
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NANOCOMPOSITE materials , *SURFACE coatings , *CHEMICAL systems , *SILICON nitride , *SOLID solutions , *LASER beams , *CRYSTAL grain boundaries , *TRANSMISSION electron microscopy - Abstract
The microstructures of nanostructured Ti–Si–N hard coatings were investigated by transmission electron microscopy and pulsed laser atom probe. C and O impurities were detected. No evidence of increased Si levels at the grain boundaries was found, suggesting that Si is either in the form of a layer too thin to be detected using the techniques employed or in the form of a solid solution of SiN clusters. [Copyright &y& Elsevier]
- Published
- 2010
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