5 results on '"Decay length"'
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2. Selective Sputtering and Ion Beam Mixing Effects on SIMS Depth Profiles
3. Gibbsian Segregation During the Depth Profiling of Copper in Silicon
4. Species-Specific Modification of Depth Resolution in Sputtering Depth Profiles by Oxygen Adsorption
5. Sputter-Induced Segregation of As in Si During SIMS Depth Profiling
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