1. Compression-Assisted Adaptive ECC and RAID Scattering for NAND Flash Storage Devices.
- Author
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Lim, Seung-Ho and Park, Ki-Woong
- Subjects
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FLASH memory , *LOSSLESS data compression , *BIT error rate , *LEGACY systems , *STORAGE - Abstract
NAND flash memory-based storage devices are vulnerable to errors induced by NAND flash memory cells. Error-correction codes (ECCs) are integrated into the flash memory controller to correct errors in flash memory. However, since ECCs show inherent limits in checking the excessive increase in errors, a complementary method should be considered for the reliability of flash storage devices. In this paper, we propose a scheme based on lossless data compression that enhances the error recovery ability of flash storage devices, which applies to improve recovery capability both of inside and outside the page. Within a page, ECC encoding is realized on compressed data by the adaptive ECC module, which results in a reduced code rate. From the perspective of outside the page, the compressed data are not placed at the beginning of the page, but rather is placed at a specific location within the page, which makes it possible to skip certain pages during the recovery phase. As a result, the proposed scheme improves the uncorrectable bit error rate (UBER) of the legacy system. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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