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Device modeling of CH 3 NH 3 PbI 3−x Cl x based electron transport layer-free planar perovskite solar cells was performed. The simulation was conducted by the program SCAPS (Solar Cell Capacitance Simulator). With appropriate physical parameters, a high open-circuit voltage of 1.04 V close to results reported experimentally was successfully reproduced in the simulation. Simulation results revealed a great dependence of PCE on the thickness and defect density of the perovskite layer. An optimum perovskite thickness of about 500 nm was confirmed and it well consistent with the thickness range of real devices was derived. Meanwhile, parameters including the FTO/perovskite interface defect density as well as the doping concentration of the front contact (FTO) were identified to significantly influence the performance of the device. In particular, the interface quality at the FTO/perovskite interface has greater impact on the device parameters than that at the perovskite/HTL interface, which suggests that more attention should be paid to the front FTO/perovskite interface to further enhance the performance of electron transport layer-free device. Appropriate interface defect passivation to reduce the interface defect density to the order of ~10 15 cm −3 is necessary and urgently needed. Lastly, the effect of the electron and hole mobility and carrier diffusion length of CH 3 NH 3 PbI 3−x Cl x were also analyzed and the results revealed that the mobility and diffusion length experimentally reported (~1.0 µm) are large and long enough for high efficiency. [ABSTRACT FROM AUTHOR]

Perovskite solar cells (PVKSCs) are an attractive technology that finds their potential in the field of renewable energy sources. Transparent conductive oxides including fluorine-doped tin dioxide (FTO) and indium tin oxide (ITO) with high optical transmittance and low electrical resistivity are key components in PVKSCs. While commercial FTO or ITO either requires high temperature and high vacuum process or contains rare indium element, which will increase the production cost of PVKSCs. Here we report efficient electron-transport layer (ETL) free planar PVKSCs using the recycled FTO/glass substrates from degraded devices. By simple and low-temperature processes including organic solvent washing, ultrasonic cleaning and UV ozone treatment, the discarded substrates can be readily reused for fabricating ETL-free planar PVKSCs. The UV–vis optical transmission, crystal structure, sheet resistance, surface morphology, elemental composition and static contact angles measurement of the original and recycled FTO/glass substrates (one time and two times) were measured and compared. Planar ETL-free devices with power conversion efficiencies of about 10% have been achieved by adopting the recycled FTO/glass substrates, which are comparable to that of the devices based on the original FTO substrates, suggesting the feasibility of recycling the FTO/glass substrates from degraded devices for fabricating ETL-free PVKSCs. [ABSTRACT FROM AUTHOR]

Planar perovskite solar cells with a p–i–n structure use both hole-transport layers and electron-transport layers to promote collection of photogenerated holes and electrons for achieving high performance, wherein a high temperature processed compact and mesoporous titanium dioxide are usually required. We report here efficient perovskite solar cells grown directly on ultraviolet–ozone treated fluorine-doped tin oxide (FTO) substrates without using any electron-transport layers. The morphology, structure, optical–electrical properties of perovskite films deposited on FTO substrates with and without ultraviolet–ozone treatment and their corresponding devices׳ performance have been studied and compared. Ultraviolet–ozone treatment of FTO substrates improves the smoothness and coverage of CH 3 NH 3 PbI 3− x Cl x films, which avoids direct contact between FTO and hole-transport layer. A planar electron-transport layer free device with a power conversion efficiency of over 10% has been achieved, suggesting that the widely adopted electron-transport layer is not a requirement for an efficient device. [ABSTRACT FROM AUTHOR]

The morphology, structure, optical and electrical properties of perovskite films treated by two different annealing methods with different annealing temperature ramp and their corresponding device performance have been studied and compared. Annealing temperature ramp significantly influences the surface morphology and optical properties of perovskite films which determines the performance of solar cells which determines the performance of solar cells . The perovskite films treated by one-step direct annealing method tend to exhibit irregular and weak ultraviolet–visible absorption spectrum, which can easily result in great variation in the final performance of solar cells. While multi-step slow annealing is beneficial for preparing highly uniform and well-crystallized perovskite films, and thus these devices present tightly-distributed performance parameters. The best device treated by multi-step slow annealing method showed a short circuit current density of 21.49 mA/cm 2 , an open circuit voltage of 0.988 V, a fill factor of 64.86%, and a power conversion efficiency (PCE) of 13.58%, which is a 57% enhancement of the overall PCE relative to 8.65% of the device treated by one-step annealing method. These findings suggest that optimized slow temperature ramp is necessary to prepare high-efficient and well-reproducible perovskite solar cells. [ABSTRACT FROM AUTHOR]