13 results on '"Haendler, S."'
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2. Characterization and modeling of drain current local variability in 28 and 14 nm FDSOI nMOSFETs
3. Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature
4. Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction
5. Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology
6. Unexpected impact of germanium content in SiGe bulk PMOSFETs
7. Characterization and modeling of low frequency noise in CMOS inverters
8. Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs
9. Impact of a 10 nm ultra-thin BOX (UTBOX) and ground plane on FDSOI devices for 32 nm node and below
10. FDSOI devices with thin BOX and ground plane integration for 32 nm node and below
11. Impact of front oxide quality on transient effects and low-frequency noise in partially and fully depleted SOI N-MOSFETs
12. Reliability of ultra-thin film deep submicron SIMOX nMOSFETs
13. Evolution of low frequency noise and noise variability through CMOS bulk technology nodes from 0.5 μm down to 20 nm
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