8 results on '"Grasser, T."'
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2. Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs
3. The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
4. A 2D non-parabolic six-moments model
5. New SOI lateral power devices with trench oxide
6. A numerical study of partial-SOI LDMOSFETs
7. Design optimization of multi-barrier tunneling devices using the transfer-matrix method
8. Influence of generation/recombination effects in simulations of partially depleted SOI MOSFETs
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