5 results on '"Kaczer, Ben"'
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2. A multi-energy level agnostic approach for defect generation during TDDB stress
3. A multi-energy level agnostic simulation approach to defect generation
4. Advanced PBTI reliability with 0.69nm EOT GdHfO gate dielectric
5. A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique
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