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Functional oxides displaying phenomena such as 2D electron gas (2DEG) at oxide interfaces represent potential technological breakthroughs for post‐CMOS (Complementary Metal Oxide Semiconductor) electronics. Noninvasive techniques are required to study the surface chemistry and electronic structure underlying their often unique electrical properties. The sensitivity of photoemission electron microscopy (PEEM) to local potential, chemistry, and electronic structure makes it an invaluable tool for probing the near surface region of microscopic regions and domains of functional materials. In particular, PEEM allows single shot acquisition of the 2D Fermi surface and full angular probing of the symmetry‐induced intensity modulations. We present results demonstrating a 2DEG at the surface of SrTiO3(001) at 140 K. The 2DEG is created by soft X‐ray irradiation and can be reversibly controlled by a combination of soft X‐rays and oxygen partial pressure. [ABSTRACT FROM AUTHOR]

We investigate electronic band-structure images in reciprocal space of few-layer graphene epitaxially grown on SiC(000-1). In addition to the observation of commensurate rotation angles of the graphene layers, the k-space images recorded near the Fermi edge highlight structures originating from diffraction of the Dirac cones due to the relative rotation of adjacent layers. The 21.9° and 27° rotation angles between two sheets of graphene are responsible for a periodic pattern that can be described with a superlattice unit cells. The superlattice generates replicas of Dirac cones with smaller wave vectors, because of a Brillouin zone folding. Copyright © 2014 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]