6 results on '"Morris, R. J. H."'
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2. O2 + probe-sample conditions for ultra low energy SIMS depth profiling of nanometre scale Si0.4 Ge0.6 /Ge quantum wells
3. Ion, sputter and useful ion yields for accurate quantification of Si1−xGex(0 < x < 1) using ultra low energy O2+ SIMS
4. The use of low-energy SIMS (LE-SIMS) for nanoscale fuel cell material development
5. The influence of beam energy on apparent layer thickness using ultralow energy O2+ SIMS on surface Si1−xGex
6. Spatial determination of gold catalyst residue used in the production of ZnO nanowires by SIMS depth profiling analysis
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