5 results on '"Diebold, Alain"'
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2. Spectroscopic ellipsometry characterization of high-k gate stacks with Vt shift layers
3. Investigation of optical properties of benzocyclobutene wafer bonding layer used for 3D interconnects via infrared spectroscopic ellipsometry
4. Spectroscopic ellipsometry studies of 3-stage deposition of CuIn1−xGaxSe2 on Mo-coated glass and stainless steel substrates
5. Spectroscopic ellipsometry studies of 3-stage deposition of CuIn1 − xGaxSe2 on Mo-coated glass and stainless steel substrates.
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