Search

Your search keyword '"SPECIMEN THICKNESS"' showing total 3 results
Start Over Descriptor "SPECIMEN THICKNESS" Journal transmission electron microscopy of semiconductor nanostructures: analysis of composition and strain state
3 results on '"SPECIMEN THICKNESS"'

1. Electron Holography: AlAs/GaAs Superlattices

Author

Höhler, Gerhard, editor, Fukuyama, Hidetoshi, editor, Kühn, Johann H., editor, Müller, Thomas, editor, Ruckenstein, Andrei, editor, Steiner, Frank, editor, Trümper, Joachim, editor, Wölfle, Peter, editor, Niekisch, E. A., editor, and Rosenauer, Andreas

Published
2003
Full Text
View/download PDF

2. Lattice Fringe Analysis

Author

Höhler, Gerhard, editor, Fukuyama, Hidetoshi, editor, Kühn, Johann H., editor, Müller, Thomas, editor, Ruckenstein, Andrei, editor, Steiner, Frank, editor, Trümper, Joachim, editor, Wölfle, Peter, editor, Niekisch, E. A., editor, and Rosenauer, Andreas

Published
2003
Full Text
View/download PDF

3. Introduction

Author

Höhler, Gerhard, editor, Fukuyama, Hidetoshi, editor, Kühn, Johann H., editor, Müller, Thomas, editor, Ruckenstein, Andrei, editor, Steiner, Frank, editor, Trümper, Joachim, editor, Wölfle, Peter, editor, Niekisch, E. A., editor, and Rosenauer, Andreas

Published
2003
Full Text
View/download PDF

Catalog

Books, media, physical & digital resources
See catalog results