14 results on '"Joan Figueras"'
Search Results
2. Diagnosis of Full Open Defects in Interconnecting Lines.
3. Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
4. BIST Technique by Equally Spaced Test Vector Sequences.
5. IDDQ Testing of Opens in CMOS SRAMs.
6. Test of RAM-based FPGA: methodology and application to the interconnect.
7. Bridges in sequential CMOS circuits: current-voltage signatur.
8. On estimating bounds of the quiescent current for IDDQ testin.
9. Enhancing realistic fault secureness in parity prediction array arithmetic operators by IDDQ monitoring.
10. Detecting IDDQ defective CMOS circuits by depowering.
11. Testability of floating gate defects in sequential circuits.
12. Analysis of IDDQ detectable bridges in combinational CMOS circuits.
13. Analysis of redundant structures in combinational circuits.
14. Power Dissipation During Testing: Should We Worry About it?
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.