1. 基于高光谱成像的苹果损伤检测方法研究.
- Author
-
王 凡, 孟翔宇, 陈龙跃, 段丹丹, and 钱英军
- Subjects
SPECTRAL reflectance ,SPECTRAL sensitivity ,APPLE growing ,SPECTRAL imaging ,PRODUCTION management (Manufacturing) ,APPLES - Abstract
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- Published
- 2023
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