Search

Nickel oxide thin Slims with the thickness of about 480 nm were prepared by glancing angle DC reactive magnetron sputtering. The surface and cross-section morphologies and chemical compositions were charac¬terized by the field emission scanning electron microscope and the energy dispersive spectrometer. The cyclic voltammetry, optical modulation, optical density varying and colorization of NixOy thin films were e¬valuated by the electrochemical workstation and the ultraviolet visible spectrophotometer, respectively. The ion diffusion rates were calculated from linear tatting as a function of scanning rates. The coloring/Meaning re¬sponse time was obtained from the chronograph current measurements. The results show that the surface mor¬phology of NixOy films deposited at 80° glancing-angle was loose and porous. The cross-section presents inclined columnar structure, which provided a large specific surface area for the injection/extraction of ions or electrons. Under the driving potential of ±1.2 V, the electrochemical capacity and the rates of ion diffusion were significantly improved, resuming in excellent optical modulation and colorization resiliency. Meanwhile, the NixOy films presented good cyclic stability and rapid response characteristics. [ABSTRACT FROM AUTHOR]