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1. Guest Editorial Special Section on the 2011 IEEE Custom Integrated Circuits Conference (CICC 2011).

2. Guest Editorial: Special Section on the 2014 IEEE Custom Integrated Circuits Conference (CICC 2014).

3. Guest EditorialSpecial Section on the 2013 IEEE Custom Integrated Circuits Conference (CICC 2013).

4. Hope seen for taming IC process variability at next design node.