13 results on '"Maggipinto, Marco"'
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2. IntroVAC: Introspective Variational Classifiers for learning interpretable latent subspaces
3. β-Variational Classifiers Under Attack
4. DeepVM: A Deep Learning-based approach with automatic feature extraction for 2D input data Virtual Metrology
5. On Optimising Spatial Sampling Plans for Wafer Profile Reconstruction
6. A Dynamic Sampling Approach for Cost Reduction in Semiconductor Manufacturing
7. A Convolutional Autoencoder Approach for Feature Extraction in Virtual Metrology
8. A Deep Convolutional Autoencoder-Based Approach for Anomaly Detection With Industrial, Non-Images, 2-Dimensional Data: A Semiconductor Manufacturing Case Study.
9. $\beta$-Variational Classifiers Under Attack
10. Exploiting 2D Coordinates as Bayesian Priors for Deep Learning Defect Classification of SEM Images.
11. Induced Start Dynamic Sampling for Wafer Metrology Optimization.
12. A Computer Vision-Inspired Deep Learning Architecture for Virtual Metrology Modeling With 2-Dimensional Data.
13. Laundry Fabric Classification in Vertical Axis Washing Machines Using Data-Driven Soft Sensors.
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