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This article proposes a methodology for critical path selection and delay sensor insertion for aging monitoring in field-programmable gate arrays (FPGAs). The aging information can be used to reconfigure FPGAs to achieve better performance or wear leveling. To filter out the paths aging less aggressively, our methodology decides based on both physical-level parameters [e.g., path delay, process variation, temperature, static stress (duty cycle), and dynamic stress (switching activity) as well as aging-relevant parameters (e.g., fan-out, and endpoint physical location)]. After selection of an optimal set of paths, age sensors, introduced in our earlier work, are placed in a distributed fashion throughout the FPGA area to provide aging information of its various parts as they are being used. Accurate aging models for FPGAs are required to determine the contribution of the above-mentioned parameters in aging. In this article, ASICs’ aging models are adapted for FPGAs through measurement-based fitting approach. The experimental results using various benchmarks reveal that our algorithm selects paths with a minimum error. [ABSTRACT FROM AUTHOR]

In this article, we propose a fine-grained FPGA aging mitigation method. Our method focuses on Look Up Tables (LUTs) on which Boolean functions are mapped. Based on our observations, for any configuration, even if it is carefully selected, a number of LUT transistors experience severe stress rates. Therefore, an algorithm is presented to select several alternative configurations for each LUT. Alternative configurations are obtained by LUT input reordering. These alternative configurations are rotationally loaded into the FPGA. Experimental results shows that our method achieves 263 and 14.1 percent Mean Time To Failure (MTTF) improvement for Hot Carrier Injection (HCI) and Bias Temperature Instability (BTI), respectively. Additionally, due to changing only local routings, our method imposes up to 1 percent performance overhead to the systems. [ABSTRACT FROM AUTHOR]