1. Fabrication and analysis of ZnO and Al-doped ZnO films using the SILAR technique.
- Author
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Kara, İlker, Rashid Hafedh, Abjar Ibrahim, and Raheem Waeli, Ihsan Sadeq
- Subjects
- *
FABRICATION (Manufacturing) , *ZINC oxide , *X-ray diffraction , *ABSORPTION , *CRYSTALLIZATION - Abstract
In this study, pure ZnO and Al-doped ZnO thin films at different concentrations were successfully grown on an ITO substrate using the SILAR method. The produced thin films were characterized by SEM/EDS, XRD, and UV-Vis spectroscopy. According to the XRD analysis results, it was observed that the produced thin films crystallized on a nanometer scale, and the crystallization quality varied depending on the concentration of Al doping. SEM/EDS analysis results indicated that Al-doped ZnO thin films affected the morphology, forming nano-root structures. UV-Vis analysis results showed that the band gap values of the thin films produced varied depending on the Al dopant, with decreased values, sharper absorption edges, and increased absorption intensities. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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