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3 results on '"K. Fedus"'

1. Image formation and applications to third order nonlinear optical measurement techniques

Author

Coulombier, Q., Sergent, M., Trolès, J., Canat, G., Vasseur, O., Bourdon, P., Cathelinaud, M., Zhang, X.H., M. Cathelinaud, M. Cathelinaud, Nazabal, Virginie, F. Charpentier, F. Charpentier, J. L. Adam, J., K. Fedus, K. Fedus, G. Boudebs, G. Boudebs, M. Chauvet, M. Chauvet, G. Fanjou, G. Fanjou, K. P. Huy, K., T. Billeton, T Billeton, S. P. Gorza, S., W. D. Shen, W., Manzani, Danilo, Napoli, Mariana, Ribeiro, Sidney J.L., de Araújo, Cid, Besse, Valentin, Leblond, Hervé, Boudebs, Georges, Fedus, K., Institut des Sciences Chimiques de Rennes (ISCR), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut des Sciences Moléculaires de Marseille (ISM2), Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institute of Chemistry, São Paulo State University, Departamento de Fisica, Universidade Federal de Pernambuco, Universidade Federal de Pernambuco [Recife] (UFPE), Laboratoire de Photonique d'Angers (LPHIA), Université d'Angers (UA), Propriétés Optiques des Matériaux et Applications (POMA), Université d'Angers (UA)-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA), Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Institut de Chimie du CNRS (INC), and Centre National de la Recherche Scientifique (CNRS)-Université d'Angers (UA)

Subjects
Diffraction, Physics, Image formation, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Helmholtz equation, business.industry, Acoustics, Nonlinear optics, 01 natural sciences, Signal, 010309 optics, Optics, Simple (abstract algebra), 0103 physical sciences, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Sensitivity (control systems), 010306 general physics, business, Diffraction grating, ComputingMilieux_MISCELLANEOUS
Abstract

We perform third order nonlinear optical characterizations using I-scan or Z-scan techniques inside a 4-f system. Simulation is performed based on Helmholtz equation to provide simple expressions relating the signal to the phase shift (in different wave-mixing configurations). Optimization of the measurement is performed.

Published
2012
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2. Photo-stability of pulsed laser deposited Ge(x)As(y)Se(100-x-y) amorphous thin films.

Author

Němec P, Zhang S, Nazabal V, Fedus K, Boudebs G, Moreac A, Cathelinaud M, and Zhang XH

Abstract

Quest for photo-stable amorphous thin films in ternary Ge(x)As(y)Se(100-x-y) chalcogenide system is reported. Studied layers were fabricated using pulsed laser deposition technique. Scanning electron microscope with energy dispersive X-ray analyzer, Raman scattering spectroscopy, transmittance measurements, variable angle spectroscopic ellipsometry, and non-linear imaging technique with phase object inside the 4f imaging system were employed to characterize prepared thin films. Their photo-stability/photo-induced phenomena in as-deposited and relaxed states were also investigated, respectively. In linear regime, we found intrinsically photo-stable relaxed layers within Ge(20)As(20)Se(60) composition. This composition presents also the highest optical damage threshold under non-linear optical conditions.

Published
2010
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3. Linear optical characterization of transparent thin films by the Z-scan technique.

Author

Boudebs G and Fedus K

Abstract

We report experimental characterization of a very small rectangular phase shift (<0.3 rad) obtained from the far-field diffraction patterns using a closed aperture Z-scan technique. The numerical simulations as well as the experimental results reveal a peak-valley configuration in the far-field normalized transmittance, allowing us to determine the sign of the dephasing. The conditions necessary to obtain useful Z-scan traces are discussed. We provide simple linear expressions relating the measured signal to the phase shift. A very good agreement between calculated and experimental Z-scan profiles validates our approach. We show that a very well known nonlinear characterization technique can be extended for linear optical parameter estimation (as refractive index or thickness).

Published
2009
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