1. Methodology to Prepare Patent Analysis and the Technological Maturity Cycle.
- Author
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Sinisterra, Santiago, Camargo-Amado, Rubén, Triviño, Diego, and Machuca-Martínez, Fiderman
- Subjects
CAPABILITY maturity model ,PATENTS ,ORBITS (Astronomy) ,BEHAVIORAL assessment ,DATA extraction ,ECONOMIC trends ,DECISION making - Abstract
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- Published
- 2023
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