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We present the characterization of a pn-junction GaAs nanowire. For the characterization, current–voltage, electron-beam-induced current, cathodoluminescence, and electron holography measurements are used. We show that by combining information from these four methods, in combination with drift-diffusion modelling, we obtain a detailed picture of how the nanowire pn-junction is configured and how the recombination lifetime varies axially in the nanowire. We find (i) a constant doping concentration and 600 ps recombination lifetime in the n segment at the top part of the nanowire; (ii) a 200–300 nm long gradient in the p doping next to the pn-junction; and (iii) a strong gradient in the recombination lifetime on the p side, with 600 ps lifetime at the pn-junction, which drops to 10 ps at the bottom of the p segment closest to the substrate. We recommend such complementary characterization with multiple methods for nanowire-based optoelectronic devices. [ABSTRACT FROM AUTHOR]

The behavior of carriers for an electron‐beam‐induced current (EBIC) evaluation is experimentally and theoretically analyzed for the polycrystalline Cu (In, Ga)Se2 (CIGS) thin‐film solar cells. The experimental EBIC signal in‐depth profiles of the CIGS layers show four features: peaks at grain boundaries (GBs), narrowed peaks near the surface, shifted peaks near the surface, and double peaks at the GBs and surface. Operating principles for CIGS solar cell devices under electron–hole pair excitation are systematically revealed utilizing a two‐dimensional theoretical EBIC simulation: (i) The EBIC peaks at the GBs are caused by a high hole barrier, including a valence band offset (ΔEV) and a band bending at the GBs; (ii) narrowing of EBIC peaks near the surface is caused by high defect densities at the GBs, grading of a conduction band minimum, and grading of acceptor concentration (Na) along with the CIGS depth direction; (iii) a shift in EBIC peaks near the surface is caused by high donor‐like defect densities at the surface; (iv) double peaks at the GBs and surface are caused by a thick surface layer (SL) with the ΔEV and the hole barrier at GBs. These findings of the EBIC analysis will help to comprehensively understand the complex polycrystalline CIGS carrier transport mechanism in realizing the highest‐efficiency CIGS solar cells. [ABSTRACT FROM AUTHOR]

We present the characterization of a pn-junction GaAs nanowire. For the characterization, current–voltage, electron-beam-induced current, cathodoluminescence, and electron holography measurements are used. We show that by combining information from these four methods, in combination with drift-diffusion modelling, we obtain a detailed picture of how the nanowire pn-junction is configured and how the recombination lifetime varies axially in the nanowire. We find (i) a constant doping concentration and 600 ps recombination lifetime in the n segment at the top part of the nanowire; (ii) a 200–300 nm long gradient in the p doping next to the pn-junction; and (iii) a strong gradient in the recombination lifetime on the p side, with 600 ps lifetime at the pn-junction, which drops to 10 ps at the bottom of the p segment closest to the substrate. We recommend such complementary characterization with multiple methods for nanowire-based optoelectronic devices.

The electron-beam-induced current (EBIC) method is utilized in this work to visualize conductive channels formed in graphene oxide as a result of resistive switching. Using metal–insulator–semiconductor (MIS) structures, an increase in the electron beam induced current by a few orders of magnitude as compared with the EBIC signal in metal–insulator–metal (MIM) structures is achieved. The mechanism of the EBIC image formation related to the conductive channels is explained by the separation and collection of the e-beam generated excess carriers by rectifying barrier nanocontacts formed at the graphene oxide/Si interface during resistive switching. It is shown that the collection efficiency of the formed nanocontacts decreases with the beam energy, in agreement with the theoretical predictions for the Schottky-like nanocontacts. An important advantage of the EBIC method is demonstrated in its ability to monitor the generation and elimination of high density conductive channels even when the current–voltage measurements cannot detect and separate these processes. EBIC study of the dynamics of the conductive channel formation can help better understand the underlying physical mechanisms of their generation. [ABSTRACT FROM AUTHOR]

The geometric parameters of the grain boundaries that make up triple joints and their possible combinations are studied by electron backscatter diffraction using Channel HKL5 software. It is shown experimentally that, in addition to the previously studied and fairly widespread triple joints of special grain boundaries, there are other varieties of them. It is found that at these triple junctions, in particular, the geometric combination rule is violated, which may indirectly indicate the recombination activity of special boundaries. [ABSTRACT FROM AUTHOR]

The properties of extended defects introduced by plastic deformation at 600 °C in n‐Si co‐doped with gold are studied by the electron‐beam‐induced current (EBIC) and deep‐level transient spectroscopy (DLTS) methods. It is shown that intrinsic point defects generated by moving dislocations stimulate the gold redistribution. As a result, regions depleted with gold are formed near dense dislocation rows. It is shown that dislocation trails decorated with gold are charged, which is a reason for the formation of bright EBIC contrast outside the Schottky barrier. [ABSTRACT FROM AUTHOR]

The electron-beam-induced current (EBIC) method is utilized in this work to visualize conductive channels formed in graphene oxide as a result of resistive switching. Using metal–insulator–semiconductor (MIS) structures, an increase in the electron beam induced current by a few orders of magnitude as compared with the EBIC signal in metal–insulator–metal (MIM) structures is achieved. The mechanism of the EBIC image formation related to the conductive channels is explained by the separation and collection of the e-beam generated excess carriers by rectifying barrier nanocontacts formed at the graphene oxide/Si interface during resistive switching. It is shown that the collection efficiency of the formed nanocontacts decreases with the beam energy, in agreement with the theoretical predictions for the Schottky-like nanocontacts. An important advantage of the EBIC method is demonstrated in its ability to monitor the generation and elimination of high density conductive channels even when the current–voltage measurements cannot detect and separate these processes. EBIC study of the dynamics of the conductive channel formation can help better understand the underlying physical mechanisms of their generation.

We developed a high spatially-resolved ion-imaging system using focused electron beam excitation. In this system, we designed a nanometric thin sensor substrate to improve spatial resolution. The principle of pH measurement is similar to that of a light-addressable potentiometric sensor (LAPS), however, here the focused electron beam is used as an excitation carrier instead of light. A Nernstian-like pH response with a pH sensitivity of 53.83 mV/pH and linearity of 96.15% was obtained. The spatial resolution of the imaging system was evaluated by applying a photoresist to the sensing surface of the ion-sensor substrate. A spatial resolution of 216 nm was obtained. We achieved a substantially higher spatial resolution than that reported in the LAPS systems.

In Cu(In,Ga)Se2 (CIGS) thin‐film solar cells, laterally inhomogeneous distributions of point defects may induce electrostatic potential fluctuations and thus reduce the open‐circuit voltage (Voc). In the present work, we investigate possible origins of fluctuating potentials and estimate the amplitude of fluctuations and Voc losses in solar cells with various [Ga] in the CIGS absorber, with different buffer layers and with different durations of an RbF postdeposition treatment (PDT). Electron‐beam‐induced current measurements were employed to study the local difference in the width of the space‐charge region (wSCR). It is shown that the amplitude of fluctuations in the wSCR depends significantly on the choice of buffer system and on the duration of the RbF PDT. In addition, energy‐dispersive X‐ray spectroscopy and cathodoluminescence measurements reveal that band‐gap fluctuations do not have substantial impact on the device performance. Finally, some of the investigated cells were exposed to light soaking, which was found to be a means to reduce the detected electrostatic potential fluctuations and also to increase the effective electron diffusion length in the CIGS absorber for a part of the investigated cells. [ABSTRACT FROM AUTHOR]

A (ZnSe)0.85(CuIn0.7Ga0.3Se2)0.15 photocathode with a bilayer structure was fabricated and found to exhibit a photocurrent almost twice that of a photocathode with a monolayer structure during hydrogen evolution from water. The cathodic photocurrent reached maximum values of 12 and 4.9 mA cm−2 at 0 and 0.6 VRHE in a neutral phosphate buffer under simulated sunlight, while the half-cell solar-to-hydrogen conversion efficiency was 3.0 % at 0.6 VRHE, with a maximum value of 3.6 % at 0.45 VRHE. Cross-sectional mapping of the electron-beam-induced current established that the increased photocurrent can be attributed to improved uniformity at the solid-liquid junction in the bilayer sample, which results in enhanced carrier collection. [ABSTRACT FROM AUTHOR]

The effect of Σ3 generation on random grain boundaries (R-GBs) were investigated using multicrystalline Si (mc-Si) grown from the microcrystalline template with random orientation. There existed three cases for the contrast variation of electron-beam-induced current (EBIC) on R-GBs after Σ3 generation from them, namely decrease, increase and constant cases. No clear tendency of EBIC contrast variation was found at the initial growth stage. On the other hand, the constant case became dominant at the steady state. This result indicates that Σ3 generation does not affect the electrical activity of R-GBs. [ABSTRACT FROM AUTHOR]

The method of electron-beam-induced current (EBIC) was used to visualize the defect sites on a p-type (boron-doped) diamond (001) film. For this purpose, an Ag-Schottky layer (~ 2 mm × ~ 2 mm × ~ 50 nm) was deposited on the oxygen-terminated p-type diamond (001) film and used as a source of EBIC signal. The signal current of EBIC image appeared to be as large as ~ 1200 times that of the incident electron-beam current and the difference range in image intensity was also large (1–1200). The observed EBIC images showed many kinds of signatures that are possible ‘killer’ defects for Schottky devices. In order to identify ‘killer’ defects in the EBIC image, an array of Ag-dots (~ 40 × ~ 50 μm 2 ) was deposited on an oxygen-terminated p-type diamond (001) film and I–V characteristics were measured on 53 Ag-dots. The resulting I–V characteristics showed that 21 Ag-dots reside on ‘killer’ defects. Comparison between the EBIC image and the positions of Ag-dots residing on ‘killer’ defects showed that large dark dots in EBIC image correspond to the position of ‘killer’ defects. The number density of the large dark dots (i.e., ‘killer’ defects) was ~ 10 4 /cm 2 in the present sample. It is suggested that a high yield Schottky-junction device may be fabricated by avoiding these ‘killer’ defects by the use of EBIC. [ABSTRACT FROM AUTHOR]

The method of electron-beam-induced current (EBIC) was used to visualize the defect sites on a p-type (boron-doped) diamond (001) film. For this purpose, an Ag-Schottky layer (~ 2 mm × ~ 2 mm × ~ 50 nm) was deposited on the oxygen-terminated p-type diamond (001) film and used as a source of EBIC signal. The signal current of EBIC image appeared to be as large as ~ 1200 times that of the incident electron-beam current and the difference range in image intensity was also large (1–1200). The observed EBIC images showed many kinds of signatures that are possible ‘killer’ defects for Schottky devices. In order to identify ‘killer’ defects in the EBIC image, an array of Ag-dots (~ 40 × ~ 50 μm 2 ) was deposited on an oxygen-terminated p-type diamond (001) film and I–V characteristics were measured on 53 Ag-dots. The resulting I–V characteristics showed that 21 Ag-dots reside on ‘killer’ defects. Comparison between the EBIC image and the positions of Ag-dots residing on ‘killer’ defects showed that large dark dots in EBIC image correspond to the position of ‘killer’ defects. The number density of the large dark dots (i.e., ‘killer’ defects) was ~ 10 4 /cm 2 in the present sample. It is suggested that a high yield Schottky-junction device may be fabricated by avoiding these ‘killer’ defects by the use of EBIC. [ABSTRACT FROM AUTHOR]

The peculiarities of the application of the electron-beam-induced current (EBIC) method for characterizing nitride-based semiconductor materials with a submicron diffusion length of excess charge carriers are analyzed. It is shown that the most reliable diffusion-length values are obtained by measuring the dependence of the induced current on the beam energy. The reasons for submicron resolution in the detection of extended defects in these materials by EBIC are discussed. [ABSTRACT FROM AUTHOR]

Abstract: In situ deformation transmission electron microscopy was used to study the attraction behavior of GaAs semiconductor nanowires (NWs). The NWs demonstrated an interesting phenomenon of either head-to-head or body-to-body attraction at distances that depend on the NW diameters. The NWs with a diameter of ∼25nm attracted at a distance of ∼25nm, while large-diameter NWs of ∼55nm showed no obvious attraction. The underlying mechanism governing the attraction of the NWs is proposed and discussed with a mechanistic model. The diameter dependence on the NW attraction behavior is discussed. The finding provides an understanding of the Ampère force in nanostructured materials caused by an electron-beam-induced current while technologically it provides useful hints for designing NW-based devices according to the diameter-dependent attraction behavior of NWs. [Copyright &y& Elsevier]

We have used transient electron-beam-induced current (EBIC) to map minority carrier lifetime distributions in multicrystalline Silicon (mc-Si). In this technique, the electron beam from a scanning transmission electron microscope was on-off modulated while the sample was scanned. The resulting transient EBIC was analyzed to form a lifetime map. An analytical function was introduced as part of the analysis in determining this map. We have verified this approach using numerical simulations and have reproduced a lifetime map for an mc-Si wafer. [ABSTRACT FROM AUTHOR]

Abstract: The present work gives an overview of how electron microscopy and its related techniques are used to analyze individual layers and their interfaces in Cu(In,Ga)(S,Se)2 thin-film solar cells. Imaging of samples can be performed at scales of down to the (sub)angstroms range. At similar spatial resolutions, information on composition can be gathered by means of energy-dispersive X-ray spectroscopy (EDX) and on spatial distributions of electrostatic Coulomb potentials in the specimen by applying electron holography. Microstructural and compositional properties as well as charge-carrier collection and radiative recombination behavior of the individual layers are accessible by use of electron backscatter diffraction, EDX, electron-beam-induced current (EBIC) and cathodoluminescence measurements, available in scanning electron microscopy. The present contribution gives an overview of the various scanning and transmission electron microscopy techniques applied on Cu(In,Ga)(S,Se)2 thin-film solar cells, examples from case studies, and also demonstrates how these techniques may be combined in order to improve the analysis. Particularly, EBIC results show a reduced charge-carrier collection at Cu(In,Ga)Se2 grain boundaries, while no indication was found for a charge accumulation at the grain boundaries by electron holography. [Copyright &y& Elsevier]

We developed a high spatially-resolved ion-imaging system using focused electron beam excitation. In this system, we designed a nanometric thin sensor substrate to improve spatial resolution. The principle of pH measurement is similar to that of a light-addressable potentiometric sensor (LAPS), however, here the focused electron beam is used as an excitation carrier instead of light. A Nernstian-like pH response with a pH sensitivity of 53.83 mV/pH and linearity of 96.15% was obtained. The spatial resolution of the imaging system was evaluated by applying a photoresist to the sensing surface of the ion-sensor substrate. A spatial resolution of 216 nm was obtained. We achieved a substantially higher spatial resolution than that reported in the LAPS systems. [ABSTRACT FROM AUTHOR]

An electron-beam-induced-current technique has been applied to scanning transmission electron microscopy to characterize GaN/AlGaN/n-Si heterostructures. The structure was formed by metalorganic vapor phase epitaxy using AlGaN as an intermediate layer. Two samples with nominal intermediate layer thicknesses of 60 and 120 nm were studied. It was found that there is a junction in the n-type Si region underneath the nitride/Si interface irrespective of the intermediate layer thickness, whereas induced current occurred neither in the nitride region nor at the nitride/Si interface. The junction formed was found to be undulated. The sample with the thin intermediate layer had undulations of a shorter periodicity than that with the thick intermediate layer. The formation of the junction is attributed to the diffusion of Al during the nitride growth. [ABSTRACT FROM PUBLISHER]

Degradation of InGaAsP-InP-based buried-heterostructure bulk (BH-bulk) lasers has been studied by means of electroluminescence (EL), photoluminescence (PL), electron-beam-induced current (EBIC) and transmission electron microscopy (TEM). Lasers with p/n as well as semi-insulating (SI) current-blocking layers were studied. The results show that moderate increases in the threshold current correlate well with formation of dark defects (DD's) (i.e., dark-line defects (DLD's) or dark-spot defects (DSD's), which cannot be distinguished in our case due to the narrowness of the laser stripe.) The DD's were found to be caused by dislocation loops. The dependence of threshold current increase on the number of DD's is explained in terms of a model which includes effects due to the DD's, as well as changes in the regions outside the DD's. The latter is found to be responsible for the major part of the threshold current increase. Values for the ratio between the carrier lifetimes inside and outside the DD's are presented, for the first time. In our lasers, strong degradation differs from moderate degradation in that DD's do not form during aging. The presence of dislocation loops only at the sidewalls of the active stripe in lasers with p/n current-blocking layers points to the sidewalls as being critical. The near absence of dislocation loops and the smaller increase in threshold current in SI lasers which have degraded strongly, compared to the strongly degrading p/n lasers, suggest that strong degradation is a synergistic combination of damage in the sidewalls and Zn indiffusion from the current-blocking layers [ABSTRACT FROM PUBLISHER]

The junction between the base and the collector of an npn Si transistor-chip was exposed by angle lapping and microscopically observed. The specimen thus prepared under various bias conditions was observed by SEM and electron-acoustic microscopy (EAM). The results are as follows. (1) The site of acoustic signal generation by irradiation of the chopped electron beam remains unchanged under varying bias voltages. (2) The amplitude of the acoustic signal changes under various bias conditions. (3) The acoustic signal- and electron-beam-induced current signals nearly correspond to each other under bias applications, but they are clearly different signal modes. The mechanism of acoustic signal generation is suggested and discussed. [ABSTRACT FROM PUBLISHER]

Developing nanoscale electrical characterization techniques adapted to three-dimensional (3D) geometry is essential for optimization of the epitaxial structure and doping process of nano- and microwires. In this paper, we demonstrate the assessment of the depletion width as well as the doping profile at the nanoscale of individual microwire core-shell light-emitting devices by capacitance-voltage measurements. A statistical study carried out on single wires shows the consistency of the doping profile values measured for individual microwires compared to assemblies of hundreds of wires processed on the same sample. The robustness of this method is then demonstrated on four epitaxial structures with different growth and doping conditions. Finally, electron-beam-induced current and secondary electron profiles are used to validate the depletion region width and the position in the core-shell structure.

Current leakage sites in diamond p–n junction are determined by measuring an electron‐beam–induced current (EBIC) technique and conductive atomic force microscopy (C‐AFM). Current leakage sites in p–n diodes, particularly, can be determined by means of EBIC without destruction of the device structure. From EBIC observation, bright spots with higher signal intensity than these in surrounding region are observed in p–n diodes, and these spots strongly correlate with the leakage current. It is found that these bright spots are originating from pits of comet‐shaped defects observed by a scanning electron microscope. With C‐AFM, the leakage current is detected at pits of comet‐shaped defects. Reduction in comet‐shaped defects shall be reduced using the technique of reduction in dislocation and high‐quality crystal growth to suppress the leakage current. [ABSTRACT FROM AUTHOR]

High-efficiency crystalline silicon (Si) solar cells require textured surfaces for efficient light trapping. However, passivation of a textured surface to reduce carrier recombination is difficult. Here, we relate the electrical properties of cells fabricated on a KOH-etched, random pyramidal-textured Si surface to the nanostructure of the passivated contact and the textured surface morphology. The effects of both microscopic pyramidal morphology and nanoscale surface roughness on passivated contacts consisting of polycrystalline Si ( poly -Si) deposited on top of an ultrathin, 1.5-2.2 nm, SiO x layer are investigated. Using atomic force microscopy, we show a pyramid face, which is predominantly a Si(111) plane to be significantly rougher than a polished Si(111) surface. This roughness results in a nonuniform SiO x layer as determined by transmission electron microscopy of a poly -Si/SiO x contact. Our device measurements also show an overall more resistive and hence a thicker SiO x layer over the pyramidal surface as compared to a polished Si(111) surface, which we relate to increased surface roughness. Using electron-beam-induced current measurements of poly -Si/SiO x contacts, we further show that the SiO x layer near the pyramid valleys is preferentially more conducting and hence likely thinner than over pyramid tips, edges, and faces. Hence, both the microscopic pyramidal morphology and nanoscale roughness lead to a nonuniform SiO x layer, thus leading to poor poly -Si/SiO x contact passivation. Finally, we report >21% efficient and ≥80% fill-factor front/back poly -Si/SiO x solar cells on both single-side and double-side textured wafers without the use of transparent conductive oxide layers, and show that the poorer contact passivation on a textured surface is limited to boron-doped poly -Si/SiO x contacts.

A (ZnSe) 0.85 (CuIn 0.7 Ga 0.3 Se 2 ) 0.15 photocathode with a bilayer structure was fabricated and found to exhibit a photocurrent almost twice that of a photocathode with a monolayer structure during hydrogen evolution from water. The cathodic photocurrent reached maximum values of 12 and 4.9 mA cm -2 at 0 and 0.6 V RHE in a neutral phosphate buffer under simulated sunlight, while the half-cell solar-to-hydrogen conversion efficiency was 3.0 % at 0.6 V RHE , with a maximum value of 3.6 % at 0.45 V RHE . Cross-sectional mapping of the electron-beam-induced current established that the increased photocurrent can be attributed to improved uniformity at the solid-liquid junction in the bilayer sample, which results in enhanced carrier collection., (© 2016 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.)

Solution processing of Cu2ZnSn(S,Se)4 (CZTSSe)-kesterite solar cells is attractive because of easy manufacturing using readily available metal salts. The solution-processed CZTSSe absorbers, however, often suffer from poor morphology with a bilayer structure, exhibiting a dense top crust and a porous bottom layer, albeit yielding efficiencies of over 10%. To understand whether the cell performance is limited by this porous layer, a systematic compositional study using (scanning) transmission electron microscopy ((S)TEM) and energy-dispersive X-ray spectroscopy of the dimethyl sulfoxide processed CZTSSe absorbers is presented. TEM investigation revealed a thin layer of CdS that is formed around the small CZTSSe grains in the porous bottom layer during the chemical bath deposition step. This CdS passivation is found to be beneficial for the cell performance as it increases the carrier collection and facilitates the electron transport. Electron-beam-induced current measurements reveal an enhanced carrier collection for this buried region as compared to reference cells with evaporated CdS.