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Potential-induced degradation (PID) in photovoltaic (PV) solar panels occurs due to the operation in strings that are part of large installations, and under determinate voltage and environmental operating conditions, especially humidity and temperature. The PID can cause decreasing of up to 40 % in the generated power capacity of the PV panel and, in the most severe cases, the end of its lifetime. When this phenomenon is detected in time, the causes can be corrected and, the effect on the PV panels could be susceptible to a reversibility process. This article presents a comparative analysis of the performance of four electrical indicators to detect PID reported in recent literature. This study is carried out by simulation, using the single-diode model to represent the PV panel, and under different irradiance and temperature conditions. The results show the advantages of an indicator based on normalized parallel resistance, in terms of its practicality and low sensitivity to changes in irradiance and temperature conditions.