Search

This work introduces the design and development of a useful software app for studying the optical properties of semiconductor materials; thus, it is possible to know if the deposited non-homogeneous semiconductor thin films are suitable for the fabrication of semiconductor devices. Using the developed algorithm, which is based on Swanepoel's methods, it is possible to estimate optical constants of non-homogeneous semiconductor films such as: absorption coefficient (a), refractive index (n) and band gap (Eg). In addition, the variation of the thickness in them is estimated. The input information for this tool corresponds to the spectral transmittance curves from experimental procedures. The proposed tool was found to offer high accuracy and therefore it can be used to study the properties of semiconductor thin films used in semiconductor manufacturing in a variety of applications, including clean and renewable energies such as solar cells. [ABSTRACT FROM AUTHOR]

Copyright of Revista Facultad de Ingeniería - UPTC is the property of Universidad Pedagogica y Tecnologica de Colombia, Facultad de Ingenieria and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

The methodology for the preparation of YBCO superconducting films on ZrO2(Y) substrates by spray pyrolysis method is reported. The transition temperature of these films is superior than the boiling temperature of liquid N2. Other critical parameters are similar to those reported by other authors using the same technique. [ABSTRACT FROM AUTHOR]