1. ДЕТЕКТОРИ ЙОНІЗУВАЛЬНОГО ВИПРОМІНЮВАННЯ НА ОСНОВІ ГРАФЕНОвих поЛЬОВИХ ТРАНЗИСТОРІВ.
- Author
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Оленич, І. Б., Бойко, Я. В., and Дзен дзелюк, О. С.
- Abstract
The ionizing radiation low-cost and portable sensors based on nanostructured materials are in demand in many fields such as safety, medicine, space, and scientific research. Graphene field-effect transistors (FETs) have high potential for radiation detection. In this study, the graphene FETs were created by depositing a film-forming suspension of reduced graphene oxide (rGO) nanoparticles on the sili- con substrate with a SiO2 or thermally oxidized porous silicon (por-Si) layer and air-drying at room temperature. The electrical characteristics of the rGO-based FETs were studied in DC and AC modes. The dependencies of the drain current on the gate voltage have linear sections, the position of which depends on the sign of the drain-source voltage. It was found that the position of the Dirac point in the FETs based on the rGO-SiO2-Si and rGO-por-Si-Si structures was near the 0.8 V gate voltage. The possibility of using the obtained FETs as ionizing radiation detectors was investigated. A linear increase in the internal resistance of the rGO film in AC mode was established with increasing duration of irradiation with ẞ-particles and y-quanta formed as a result of the decay of the 226 Ra radium isotope. The radiation detector based on the rGO-por-Si-Si structure is characterized by a higher sensitivity to ionizing radiation, which is probably due to the greater thickness of the por-Si compared to the SiO2 layer. The radiation-induced change in electrical resistance of the studied FETs was greater in the low- frequency range. We explored possible mechanisms of the ionizing radiation influence on the rGO-based FETs conductivity. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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