1. Open Standard Test Framework for Photonic Integrated Circuits
- Author
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Sylwester Latkowski, Kevin A. Williams, Dzmitry Pustakhod, Xaveer Leijtens, Michail Chatzimichailidis, Eindhoven Hendrik Casimir institute, Photonic Integration, and Center for Quantum Materials and Technology Eindhoven
- Subjects
Test ,Process (engineering) ,Computer science ,Integrated photonics ,Photonic integrated circuit ,Volume (computing) ,Photonic integrated circuits ,Test (assessment) ,Reliability engineering ,Open standard ,Scalability ,Photonic integration ,Test automation ,Production (economics) ,Reduced cost - Abstract
Test, assembly and packaging processes substantially contribute to the overall production cost of photonic integrated circuits. Implementation of test processes across the full production chain is critical in order to deliver statistically significant data sets. These will allow for optimization of the fabrication process widows, early known-good-die selection, improved models in design tools and lead to improved yield, reduced cost and scalability which will open a path to volume production. Progress on developments of open access test infrastructure at our laboratories and open standard test framework will be presented.
- Published
- 2019
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