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The 2021 release of Reimagining Our Futures Together: A New Social Contract for Education by the United Nations Educational, Scientific, and Cultural Organization was a reaction to a number of serious problems discovered in worldwide educational reforms. It sought to establish a new social compact for education to fulfill its unmet promise in the face of many educational crises and to combat future uncertainty. Using the methods of 271 Education Group as a case study, this article examines China's efforts to transform basic education in response to widespread educational issues and how they have represented the major principles espoused by the UNESCO report. The article elaborates on the coping strategies of 271 Education Group, such as incorporating eco-civilization education into basic schooling, constructing life-based curricula that are built on knowledge commons, introducing pedagogy rooted in cooperation and solidarity, and promoting teacher professional development through collaborative educational research.

Ga2O3 is a wide-band gap semiconductor of emergent importance for applications in electronics and optoelectronics. However, vital information of the properties of complex coexisting Ga2O3 polymorphs and low-symmetry disordered structures is missing. We develop two types of machine-learning Gaussian approximation potentials (ML-GAPs) for Ga2O3 with high accuracy for β/κ/α/δ/γ polymorphs and generality for disordered stoichiometric structures. We release two versions of interatomic potentials in parallel, namely soapGAP and tabGAP, for high accuracy and exceeding speedup, respectively. Both potentials can reproduce the structural properties of all the five polymorphs in an exceptional agreement with ab initio results, meanwhile boost the computational efficiency with 5 × 102 and 2 × 105 computing speed increases compared to density functional theory, respectively. Moreover, the Ga2O3 liquid-solid phase transition proceeds in three different stages. This experimentally unrevealed complex dynamics can be understood in terms of distinctly different mobilities of O and Ga sublattices in the interfacial layer. [ABSTRACT FROM AUTHOR]

In this article, the impacts of the off-state gate bias (VGS,OFF) on dynamic on-resistance (RON) are systematically investigated in commercial Schottky-type p-GaN Gate high-electron-mobility transistors. Double-pulse tester and pulsed I–V system are adopted to evaluate the dynamic RON with various off-state gate and drain bias (VDS,OFF) under hard- and soft-switching conditions. More negative VGS,OFF can aggravate the dynamic RON degradation under both soft- and hard-switching, especially when switching with a high VDS,OFF. The impacts of VGS,OFF on switching transients and off-state stress are investigated separately to reveal the underlying mechanisms, which are found to be associated with the generation and movements of holes. The off-state gate bias of the voltage-driving scheme needs to be carefully considered according to the identified mechanisms in terms of dynamic on-resistance degradation. [ABSTRACT FROM AUTHOR]