Author: "Ghilardi, T" / Publication Type: Conference Materials - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Ghilardi, T"' showing total 4 results

Start Over Author "Ghilardi, T" Publication Type Conference Materials

4 results on '"Ghilardi, T"'

1. Reliability constraints for TANOS memories due to alumina trapping and leakage.

Author: Amoroso, S.M., Mauri, A., Galbiati, N., Scozzari, C., Mascellino, E., Camozzi, E., Rangoni, A., Ghilardi, T., Grossi, A., Tessariol, P., Compagnoni, C.M., Maconi, A., Lacaita, A.L., Spinelli, A.S., and Ghidini, G.
Published: 2010
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2. A 65nm NOR flash technology with 0.042/spl mu/m/sup 2/ cell size for high performance multilevel application.

Author: Servalli, G., Brazzelli, D., Camerlenghi, E., Capetti, G., Costantini, S., Cupeta, C., DeSimone, D., Ghetti, A., Ghilardi, T., Gulli, P., Mariani, M., Pavan, A., and Somaschini, R.
Published: 2005
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3. A 65nm NOR flash technology with 0.042μm/sup 2/ cell size for high performance multilevel application

Author: Servalli, G., primary, Brazzelli, D., additional, Camerlenghi, E., additional, Capetti, G., additional, Costantini, S., additional, Cupeta, C., additional, DeSimone, D., additional, Ghetti, A., additional, Ghilardi, T., additional, Gulli, P., additional, Mariani, M., additional, Pavan, A., additional, and Somaschini, R., additional
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4. Substrate enhanced gate current: device design and temperature impact and disturbs in programming flash memories with negative body bias.

Author: Annunziata, R., Ghilardi, T., and Tosi, M.
Published: 1999
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