35 results on '"Hubert G"'
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2. Engineering TID modeling for the SEE and performances evaluations of integrated CMOS circuits at cryogenic temperatures
3. SEU Prediction for Very Integrated Circuits based on Advanced Physical Considerations
4. Implications of Work-Function Fluctuation on Radiation Robustness of FinFET XOR Circuits
5. AXEL lab.: Representative Ground Simulation for Investigating Radiation effects in Materials and Electronics
6. Single Event Transient and Functional Interrupt in Readout Integrated Circuit of Infrared Image Sensors at Low Temperatures
7. Analysis of low temperature on single event Latchup mechanisms by TCAD simulations for applications down to 50K
8. Abstract A83: Nuclear morphometry differentiates chronic pancreatitis, IPMN, and pancreatic carcinoma
9. Utilisation des composants Deep Sub-Micron dans le contexte aéronautique
10. Laser-induced fault effects in security-dedicated circuits
11. Mirage: A New Proton Facility for the Study of Direct Ionization in Sub-100nm Technologies
12. IC components reliability concerns for avionics end-users
13. A physical prediction model issued from TCAD investigations for single event burnout in power MOSFETs
14. Modeling of radiation-induced single event transients in SOI FinFETS
15. MUSCA SEP3 contributions to investigate the direct ionization proton upset in 65nm technology for space, atmospheric and ground applications
16. Effect of multiple injections on the SEEs in SRAM cell
17. Collected charge analysis for a new advanced transient model by TCAD simulation in 90nm technology
18. ICARE on-board SAC-C: More than 8 years of SEU & MCU, analysis and prediction
19. Query assistant based on experience capitalization for information retrieval systems
20. Mathematical model for the evaluation of refractory wear in the open-hearth blast furnace
21. Investigation of the influence of process and design on soft error rate in integrated CMOS technologies thanks to Monte Carlo simulation
22. Evaluation of recent technologies of non-volatile RAM
23. Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells
24. DASIE Analytical Version: A Predictive Tool for Neutrons, Protons and Heavy Ions Induced SEU Cross Section
25. Analysis of Quasi-monoenergetic neutron SEU cross sections for Terrestrial applications
26. Laser Mapping of SRAM sensitive cells. A way to obtain input parameters for DASIE calculation code
27. A review of DASIE code family: contribution to SEU/MBU understanding
28. Study of basic mechanisms induced by an ionizing particle on simple structures.
29. Large deformation change in iridium isotopes from laser spectroscopy
30. Laser performance and frequency doubling of Nd3+-doped CaWO4 at 1.06 μm
31. A query algebra for object-oriented databases integrating versions.
32. Computer-Controlled Electrophoresis Microscope
33. A query algebra for object-oriented databases integrating versions
34. A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculations.
35. Prediction of transient induced by neutron/proton in CMOS combinational logic cells.
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