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Your search keyword '"Jo, Minseok"' showing total 7 results
Start Over Author "Jo, Minseok" Publication Type Conference Materials
7 results on '"Jo, Minseok"'

6. Excellent uniformity and reproducible resistance switching characteristics of doped binary metal oxides for non-volatile resistance memory applications

Author

Lee, Dongsoo, primary, Seong, Dong-jun, additional, Choi, Hye jung, additional, Jo, Inhwa, additional, Dong, R., additional, Xiang, W., additional, Oh, Seokjoon, additional, Pyun, Myeongbum, additional, Seo, Sun-ok, additional, Heo, Seongho, additional, Jo, Minseok, additional, Hwang, Dae-Kyu, additional, Park, H. K, additional, Chang, M., additional, Hasan, M., additional, and Hwang, Hyunsang, additional

Published
2006
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7. Understanding and improving SILC behavior under TDDB stress in full gate-last high-k/metal gate nMOSFETs.

Author

Jo, Minseok, Chang Young Kang, Kah-Wee Ang, Huang, Jeff, Kirsch, Paul, and Jammy, Raj

Abstract

Stress-induced leakage current (SILC) behavior in full gate-last (FGL) high-k/metal gate devices was evaluated and compared to gate-first (GF) devices. To improve SILC characteristics, Zr was introduced into the high-k bulk region. Incorporating Zr can reduce SILC in both FGL and GF devices by suppressing trap generation in the high-k bulk region under time-dependent dielectric breakdown (TDDB) stress. However, the interfacial layer quality can be a critical SILC issue in FGL devices. [ABSTRACT FROM PUBLISHER]

Published
2012
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