Author: "KW Lee" / Publication Type: Conference Materials - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "KW Lee" Publication Type Conference Materials

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1. Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology.

Author: Sunhang Lee, Nam-Hyun Lee, G.-J. Kim, J. Ahn, Ik-Hwan Kim, S. Ha, S. Rhee, GH Bae, KW Lee, YS Lee, SB. Ko, and S. Pae
Published: 2024
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