20 results on '"Waltl, Michael"'
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2. A DLTS study on Deep Trench Processing induced Trap States in Silicon Photodiodes
3. Advanced Extraction of Trap Parameters from Single-Defect Measurements
4. All-Optical ReLU as a Photonic Neural Activation Function
5. Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability
6. Simulating and Modeling the Influence of Deep Trench Interface Recombination on Si Photodiodes
7. Metastability of Negatively Charged Hydroxyl-E’ Centers and their Potential Role in Positive Bias Temperature Instabilities
8. Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays
9. WDM-Conscious Synaptic Receptor Assisted by SOA+EAM
10. Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata
11. Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors
12. Machine Learning Prediction of Defect Formation Energies in a-SiO2
13. Defect Spectroscopy in SiC Devices
14. Low Cost and High Performance Radiation Hardened Latch Design for Reliable Circuits
15. Characterization and Modeling of Single Charge Trapping in MOS Transistors
16. IIRW 2019 Discussion Group II: Reliability for Aerospace Applications
17. Physical modeling of the hysteresis in M0S2 transistors
18. Interplay between hot carrier and bias stress components in single-layer double-gated graphene field-effect transistors
19. A single-trap study of PBTI in SiON nMOS transistors: Similarities and differences to the NBTI/pMOS case
20. Advanced data analysis algorithms for the time-dependent defect spectroscopy of NBTI
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