1. A 10 V Josephson Voltage Standard Comparison Between NIST and INMETRO as a Link to BIPM.
- Author
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Landim, Regis Pinheiro, Tang, Yi-hua, Afonso, Edson, and Ferreira, Vitor
- Subjects
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ELECTRIC potential , *JOSEPHSON junctions , *COMPARATIVE studies , *DETECTORS , *UNCERTAINTY (Information theory) , *ELECTRIC oscillators , *STANDARDS - Abstract
This paper describes a 10 V Josephson Voltage Standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO) using automatic data acquisition. The results were in agreement to within 1.1 nV and the mean difference between the two JVSs at 10 V is 0.54 nV with a pooled combined standard uncertainty of 1.48 nV. Considering a recent JVS comparison between NIST and the Bureau International des Poids et Mesures (BIPM), the difference between INMETRO and the BIPM thus was found to be -0.26 nV with a standard uncertainty of 1.76 nV. INMETRO JVS improvements since the 2006 INMETRO-BIPM comparison are also described. [ABSTRACT FROM AUTHOR]
- Published
- 2011
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