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1. Radiation hardness study of the ePix100 sensor and ASIC under direct illumination at the European XFEL

Author

Klackova, I, Ahmed, K, Blaj, G, Cascella, M, Cerantola, V, Chang, C, Dragone, A, Gode, S, Hauf, S, Kenney, C, Segal, J, Kuster, M, Sagatova, A, Klackova I., Ahmed K., Blaj G., Cascella M., Cerantola V., Chang C., Dragone A., Gode S., Hauf S., Kenney C., Segal J., Kuster M., Sagatova A., Klackova, I, Ahmed, K, Blaj, G, Cascella, M, Cerantola, V, Chang, C, Dragone, A, Gode, S, Hauf, S, Kenney, C, Segal, J, Kuster, M, Sagatova, A, Klackova I., Ahmed K., Blaj G., Cascella M., Cerantola V., Chang C., Dragone A., Gode S., Hauf S., Kenney C., Segal J., Kuster M., and Sagatova A.

Published
2021

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