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In this paper, a modification of the Angelov DC I/V model is proposed with the aim of improving its accuracy in the back-off condition under Class-B operation yet preserving its excellent prediction capabilities under high output power and saturated operations. Dispersion effects and capacitances are modelled by well-established techniques. As validation, the predictions of the model on S-parameters and load-pull circles at different bias conditions and different input power levels are shown.

In this paper, we discuss the comparison of two GaN HEMT technology processes by means of large-signal low-frequency (LF) measurements. LF load line analysis clarified the increase of output power and drain efficiency resulting from significant improvement of both knee voltage and maximum drain current by a modified technology process. The cross-check on this advantage was carried out by means of commonly adopted high-frequency load-pull measurement setups.