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Conclusions A method was developed for mass neutron-activation analysis (without chemical decomposition) of highpurity silicon. Gamma spectra from samples which were irradiated for 24–48 h in a thermal neutron flux of 1013 n/cm2-sec, and which were held for 24–72h, were obtained with a scintillation detector and multichannel analyzer. The gamma spectra were analyzed on a computer by the least-squares method. The following contaminants were found: Cu, As, Sb, Na, Au, W, and P.