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Your search keyword '"Jayasumana, A. P."' showing total 28 results

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28 results on '"Jayasumana, A. P."'

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1. Chronic interstitial nephritis in agricultural communities is a toxin-induced proximal tubular nephropathy

2. Comparison of biochemical parameters among DPP4 inhibitor users and other oral hypoglycaemic drug users: a cross-sectional study from Anuradhapura, Sri Lanka

3. The authors reply

4. Robust Kalman filter‐based decentralised target search and prediction with topology maps

5. Spatiotemporal model for Internet traffic anomalies

6. Distributed pattern detection in cyber networks

7. Performance tradeoffs of optical WDM switches using different shared limited-range wavelength conversion mechanisms

8. Survivability Performance Evaluation of WDM Networks with Wavelength Converters

9. Performance Evaluation of an All-Optical ShuffleNet using Optical Buffering and Deflection Routing

10. Internetworking of Multiwavelength Local Optical Networks Based on a Wavelength-Tolerant Receiver Technology*

11. Effects of Optical Buffering on the Performance of Manhattan Street Networks

12. Robust wavelength division multiplexed local area networks

13. Fault modelling of ECL devices

15. Performance analysis of FDDI LANs using numerical methods

16. Manifestations of faults in single- and double-BJT BiCMOS logic gates

18. Comparison of medication adherence between type 2 diabetes mellitus patients who pay for their medications and those who receive it free: a rural Asian experience

19. Register insertion bus architecture for fibre optic local area networks

21. Testing of complex gates

22. Data-feedthrough faults in circuits using unclocked storage elements

24. Space-time signal processing for distributed pattern detection in sensor networks

25. An Improved Data Flow Architecture for Logic Simulation Acceleration

26. Fault Modeling of ECL for High Fault Coverage of Physical Defects

27. Operational and Test Performance in the Presence of Built-in Current Sensors

28. Resolution Enhancement in IDDQ Testing for Large ICs

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