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Your search keyword '"Nakatsutsumi, Motoaki"' showing total 3 results
Start Over Author "Nakatsutsumi, Motoaki" Publication Type Magazines
3 results on '"Nakatsutsumi, Motoaki"'

1. Ion emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation

Author

Juha, Libor, Bajt, Saša, Guizard, Stéphane, Krása, Josef, Nassisi, Vincenzo, Burian, Tomáš, Hájková, Věra, Chalupský, Jaromír, Jelínek, Šimon, Frantálová, Kateřina, Krupka, Michal, Kuglerová, Zuzana, Singh, Sushil Kumar, Vozda, Vojtěch, Vyšín, Luděk, Wild, Jan, Šmíd, Michal, Perez-Martin, Pablo, Pan, Xiayun, Kühlman, Marion, Pintor, Juan, Cikhardt, Jakub, Dreimann, Matthias, Eckermann, Dennis, Rosenthal, Felix, Vinko, Sam M., Forte, Alessandro, Gawne, Thomas, Campbell, Thomas, Ren, Shenyuan, Shi, YuanFeng, Hutchinson, Trevor, Humphries, Oliver, Preston, Thomas, Makita, Mikako, Nakatsutsumi, Motoaki, Köhler, Alexander, Harmand, Marion, Toleikis, Sven, Falk, Kateřina, and Juha, Libor

Published
2023
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2. Initial observations of the femtosecond timing jitter at the European XFEL

Author

Kirkwood, Henry J., Letrun, Romain, Tanikawa, Takanori, Liu, Jia, Nakatsutsumi, Motoaki, Emons, Moritz, Jezynski, Tomasz, Palmer, Guido, Lederer, Max, Bean, Richard, Buck, Jens, Di Dio Cafisio, Samuele, Graceffa, Rita, Grünert, Jan, Göde, Sebastian, Höppner, Hauke, Kim, Yoonhee, Konopkova, Zuzana, Mills, Grant, Makita, Mikako, Pelka, Alexander, Preston, Thomas R., Sikorski, Marcin, Takem, Cedric M. S., Giewekemeyer, Klaus, Chollet, Matthieu, Vagovic, Patrik, Chapman, Henry N., Mancuso, Adrian P., and Sato, Tokushi

Abstract

Intense, ultrashort, and high-repetition-rate X-ray pulses, combined with a femtosecond optical laser, allow pump-probe experiments with fast data acquisition and femtosecond time resolution. However, the relative timing of the X-ray pulses and the optical laser pulses can be controlled only to a level of the intrinsic error of the instrument which, without characterization, limits the time resolution of experiments. This limitation inevitably calls for a precise determination of the relative arrival time, which can be used after measurement for sorting and tagging the experimental data to a much finer resolution than it can be controlled to. The observed root-mean-square timing jitter between the X-ray and the optical laser at the SPB/SFX instrument at European XFEL was 308 fs. This first measurement of timing jitter at the European XFEL provides an important step in realizing ultrafast experiments at this novel X-ray source. A method for determining the change in the complex refractive index of samples is also presented.

Published
2019

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