1. 48‐3: Edge Strength Measurement of Ultra‐Thin LCD Panels
- Author
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Jang, Bosun, Priestley, Richard, Tremper, Amber, Ono, Toshihiko, Shu, Yin, and Sundaram, Balamurugan M.
- Abstract
The feasibility of using Corning's edge strength measurement system (ESMS) for ultra‐thin LCD panels has been demonstrated. Panels were used to validate the load‐to‐stress correlation: digital image correlation, finite element analysis and mirror radius measurement all showed good agreement, supporting the robustness of the strength measurement. The edge strength of panels was measured by both static and dynamic ESMS. Test results revealed that dynamic ESMS is advantaged over static in better capturing the relevant flaw population owing to its larger test area. Accurate edge strength measurement via ESMS coupled with selective fracture analysis on the weakest flaws will assist in improving the edge strength of ultra‐thin LCD panels
- Published
- 2019
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