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This article describes a method for predicting improvements in stability and degradation of noise figure caused by resistive loading of low-noise and broadband amplifier input and output ports. High-performance transistor is required when designing an effective low-noise amplifier. However, suitable devices are potentially unstable at microwave frequencies that lead to oscillation. In this paper, a search algorithm was designed to identify resistor combinations that stabilize the transistor at all frequencies while providing a stability factor.

The article deals with the role of preamplifiers in producing good-quality noise measurements, highlighted at a white paper from Agilent Technologies. Information on noise level in a microwave system is presented. The paper also offers guidance on choosing the right preamplifier. It concludes that a preamplifier may be helpful if the device under test has negative gain.

The article discusses the forthcoming 2008 Institute of Electrical and Electronics Engineers/Microwave Theory and Techniques Society (IEEE/MTT-S) International Microwave Symposium (IMS) to be held in Atlanta, Georgia from June 15 to 20, 2008. The event will include a student paper competition as well as three design competitions which is conducted by 240 reviewers on the Technical Program committee for the interactive forums. The event has historically been the premier opportunity to observe and showcase the latest technology while networking with other attendees. Organizers also rearranged the schedules of the regular sessions to allow the IMS attendees to have more flexibility to attend the sessions on radio frequency integrated circuit (RFIC).