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The article focuses on the importance of advanced measurement techniques, like dielectric analysis (DEA), in ensuring product quality and optimizing processes in plastics and composites manufacturing. Topics include the challenges posed by consumer demands for recycled and bio-based materials, the role of DEA in characterizing and optimizing molding and curing processes, and the traditional use of lab-based DEA techniques for precise material analysis.

The article focuses on methods and challenges in measuring the dielectric constant and loss tangent of dielectric materials used in additive manufacturing. Topics discussed include specific measurement techniques like split-post dielectric resonators and Fabry-Perot open resonators, as well as considerations for anisotropic and inhomogeneous materials.

The article discusses the challenge in measuring and dielectric constant and loss tangent of dielectric lattice structures for additive manufacturing and presents methods used to test dielectric performance, with many only suited to a narrow range of applications. Topics include considerations for dielectric structure/media testing, common methods of dielectric constant and loss tangent measurement, and expert discussion on dielectric measurements.

The article outlines a method for enabling the spectral characterization for scientific and industrial applications. This approach results in a low noise floor with very low noise contribution from the measurement setup focusing the regulatory bodies like the FCC in the U.S. and CEPT in Europe and regulatory foundation to enable new innovative applications like 6G communications and industrial radio determination.

The article explores the measurement of a sample's dielectric properties at microwave frequencies by the use of the automated cavity perturbation technique. Elements of the method discussed include the graphic computer VNA and LabView software used, the computer algorithm needed for data control, and the layout of the experiment.

Focuses on the confusion caused by the inclusion of arc detection to the dielectric withstand test commonly referred to as the hipot test. Definition of arc detection; Importance of arc detection; Scenarios in which arc detection can be used.