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The article discusses the concept of ball-screw drunkenness. Topics covered include the way by which design engineers define lead accuracy of ball screws, the assumption that the error accumulated over 300 mm is insignificant and the response of manufacturers to requests for assemblies for precision applications with strokes of less than 300mm.

The article presents an error analysis and appropriate test method on the broadband transition of rectangular waveguide (RW) to coplanar waveguide (CPW) at U-Band, which uses a transverse E-plane probe to get a wide bandwidth. Topics include the back-to-back (BTB) transition design, simulation results and findings of the transition, and key parameters of the transition.

The article discusses how to deal with errors in designing analog-signal chain. It stresses that every component in the signal chain can create direct current (dc) and alternating (ac) errors. It details the analysis, understanding and tabulation of the errors in the signal chain so that trade-offs made could yield a feasible design. It stresses that careful selection of components and using factory and field calibrations can keep the signal chain honest and trustworthy.

The article examines the accuracy and systematic bias or errors of qualitative analysis. It explores the factors that affect the accuracy of the analysis such as the use of certified reference materials for assessing true value of the quantity and uncertainty in certified values because it changes over time. It also provides the approach of expressing bias through straightforward weight percent deviation in the measured and certified values and accuracy through correlation curves.

The article discusses the causes of time delay occuring in process analyzer of a sample system. It presents recommendations for reducing time delay and provides the tools required for the calculation within a reasonable margin of error. Furthermore, it highlights various components to be employed in the sampling conditioning systems.

Describes the common errors made in an equipment replacement analyses. Consequences of developing replacement analyses errors; Characteristics of a correct approach to the evaluation of equipment replacement proposals; Improper application of a sound method of analysis.

The article presents the computation of the sum-squared-error (SSE). Expressions that were used in solving SSE is presented. The authors found that the expressions have given only the trivial solution. In this context, they simplify the equations by using only three variables worth of data, redefining the error matrix to represent the variance accounted for. They examined that the solution only good for a certain equation.

Examines the accuracy of emitter-location systems. Root-mean-square error; Circular-error probable; Elliptical-error probable. INSETS: Fig. 1;Fig. 2;Fig. 3.

Focuses on the bit-error-rate (BER) tester as a tool for digital communications measurements. Feature of the BER meter; Implications of the pseudorandom-bit-sequence generator as transmitter for the BER meter; Impact of overflows on the error count.

The author offers information on how to use the sum of errors (S) or the square-root-of-sum-of-squares method (RSS) in creating error budget math. He mentions that he used an electronic spreadsheet to plot 500 uniform random errors, and calculated the 500 S and RSS values. He states that the RSS formula is to be use when the errors have followed a Gaussian distribution.

The article presents guidelines in measuring thermal errors in Wheatstone bridge circuits. It explains that auto-zero amplifiers (AZA) cannot compensate for measurement errors caused by sensors as temperature changes alters its resistance and the circuits output. It is recommended to add a second strain gauge (SG2) in the bridge circuit near the original sensor (SGI). Other guidelines are presented.

The article analyzes uncertainty of the power plant performance testing. A pretest uncertainty analysis and a post-test uncertainty analysis should be performed to verify whether the uncertainty limits were met or not. During a test run, several recordings are recorded for any given parameter and there will be variation in the data. The amount of variation in the data signifies random error potential for each input. If more than one sensor is used for measuring parameter then there also will be variances between the sensors based on location.

The article reports that Agilent Technologies Inc. has launched N4903A, a serial bit-error-rate tester with advanced jitter-generation features that allow testing of jitter tolerance in serial communication channels up to 12.5 Gbit/sec. It can generate different classes of jitter and can also introduce other error sources such as inter-symbol interference.

Reports that Polyspace Technologies develops software for automatic detection of run-time errors in mission-critical code. Static data flow analysis; Use of a technique called Abstract Interpretation; Creation of a listing of all the data values that could lead to errors; Use of the extracted behavior of the data from the analysis product to model the behavior of blocks of code in hierarchical models.

Discusses the role of audience estimates in media planning. Sources of error used in the research; Explanation of sample frame bias; Cause of nonresponse bias; Reason behind the existence of response bias.

Reports on a study by Aeroflex Test Solutions on instruments for the evaluation of wireless data communication systems. Background on the role of the bit error rate tester in wireless data measurements; Tools used by Aeroflex in the study; Information on the use of probability distribution functions during the characterization of wireless data communication systems.

Explains the common errors in the results of a quantitative study where statistical methods are used. Explanation of the Type I and Type II errors; Percentage on the incidence of medical errors.

Discusses optical-amplifier-gain error analysis. Calculation of decreasing open-loop-gain-induced errors; Closed-loop gain for an inverting op amp; Different error functions of the noninverting and inverting circuits with identical closed-loop gains.

Discusses two approaches to detecting and correcting errors in data transmission. Backward error correction; Forward error correction.