Search

The article focuses on various technologies used for the inspection of microelectromechanical (MEMS) devices. The technologies include near-infrared (NIR) and acoustic inspection. Optical inspection is claimed to be not enough because the defects in the devices are often located within the substrate or in the bond between devices and semiconductor wafers.

The article presents the author's analysis on the use of energy facility. He provides information on how to use the common measurement of facility energy usage using the energy utilization index (EUI) and Energy Cost Index (ECI) which can be used together or separately to get the associated costs of energy facility. He cites the use of test instruments such as infrared thermometers and digital multimeters in identifying the areas of energy waste and energy loss.

Focuses on infrared thermography inspections programs. Identification of insulation breakdowns and poor connections in electrical systems; Case inspections of boilers and heat-recovery steam generators (HRGS); Difficulties in data recording.

The article presents three ways to pursue energy retrocommissioning opportunities. The ways being discussed include the collection of the utility bills and conversion of the energy used into Btuh/sq ft/yr. and the need to complete an infrared survey of the building envelope to go on with the energy retrocommissioning opportunity method. Moreover, it pointed out the significance of the documentation of the basis of design (BofD) for the original HVAC design and the current HVAC design.