8 results on '"Dimitrakopulos, G. P."'
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2. Interfacial and Junction Line Defect Analysis for Plasticity Investigations
3. Electron Microscopy Characterization of a Graded AlN/GaN Multilayer Grown by Plasma-Assisted MBE
4. Misfit analysis of the InN/GaN interface through HRTEM image simulations
5. A method for atomistic/continuum analysis of defects in large HRTEM images
6. Exsolution phenomena in glass-ceramic systems
7. Microstructure and growth model of MBE-grown InAlN thin films
8. Epitaxial Orientations of GaN Grown on R-plane Sapphire
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