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Eryilmaz, Serkan, Glaz, Joseph, editor, and Koutras, Markos V., editor

Mitra, Murari, Khan, Ruhul Ali, and Laha, Arnab Kumar, editor

Gertsbakh, Ilya, Shpungin, Yoseph, and Misra, Krishna B., editor

Szopinski, Jacek, Kusza, Krzysztof, and Siemionow, Maria Z., editor

Wang, Yaping, Pham, Hoang, and Pham, Hoang, editor

Dougados, C., Bacciotti, F., Cabrit, S., Nisini, B., Garcia, Paulo Jorge Valente, editor, and Ferreira, Joao Miguel, editor

Kahle, Waltraud, Wendt, Heide, Nikulin, M.S., editor, Limnios, Nikolaos, editor, Balakrishnan, N., editor, Kahle, Waltraud, editor, and Huber-Carol, Catherine, editor

Gupta, Arjun K., Zeng, Wei-Bin, Wu, Yanhong, Gupta, Arjun K., Zeng, Wei-Bin, and Wu, Yanhong

Wendt, Heide, Kahle, Waltraud, Balakrishnan, N., editor, Nikulin, M. S., editor, Mesbah, M., editor, and Limnios, N., editor

Nakagawa, Toshio and Osaki, Shunji, editor

Fong, D., Meixner, M., Sutton, E. C., Castro-Carrizo, A., Bujarrabal, V., Latter, W. B., Tielens, A. G. G. M., Kelly, D. M., Szczerba, Ryszard, editor, and Górny, Sławomir K., editor

Hollenbach, David, Reipurth, Bo, editor, and Bertout, Claude, editor

Satow, Takashi, Nakagawa, Toshio, Fandel, G., editor, Trockel, W., editor, Christer, Anthony H., editor, Osaki, Shunji, editor, and Thomas, Lyn C., editor

Tedds, Jonathan A., Brand, Peter W. J. L., Burton, Michael G., Chrysostomou, Antonio, Fernandes, Amadeu J. L., Millar, T. J., editor, and Raga, A. C., editor

Hollenbach, David, Elitzur, Moshe, McKee, Christopher F., Araki, H., editor, Brézin, E., editor, Ehlers, J., editor, Frisch, U., editor, Jaffe, R. L., editor, Hepp, K., editor, Kippenhahn, R., editor, Weidenmüller, H. A., editor, Wess, J., editor, Zittartz, J., editor, Beiglböck, W., editor, Clegg, Andrew W., editor, and Nedoluha, Gerald E., editor

Schlag, G., Redl, H., Khakpour, Z., Davies, J., Pretorius, J., Schlag, Günther, editor, and Redl, Heinz, editor

Herbst, Eric, Capuzzo-Dolcetta, Roberto, editor, Chiosi, Cesare, editor, and di Fazio, Alberto, editor

Schlag, Günther, Redl, Heinz, Siegel, John H., Schlag, Günther, editor, Redl, Heinz, editor, and Siegel, John H., editor

Shin, Young-Hee, Akaike, Takaaki, Maeda, Hiroshi, Ogata, Naoya, editor, Kim, Sung Wan, editor, Feijen, Jan, editor, and Okano, Teruo, editor

Rons, N., Balona, Luis A., editor, Henrichs, Huib F., editor, and Le Contel, Jean Michel, editor

Duley, W. W., Hartquist, T. W., Sternberg, A., Wagenblast, R., Williams, D. A., and Singh, P. D., editor

Duerbeck, H. W., Seitter, W. C., Bode, M. F., Evans, A., Araki, H., editor, Ehlers, J., editor, Hepp, K., editor, Kippenhahn, R., editor, Ruelle, D., editor, Weidenmüller, H. A., editor, Wess, J., editor, Zittartz, J., editor, Cassatella, A., editor, and Viotti, R., editor

Hartquist, T. W. and McNally, Derek, editor

Dopita, M. A. and Kahn, F. D., editor

Mitchell, George F., Deveau, Terry J., Roger, R. S., editor, and Dewdney, Peter E., editor

Shull, J. Michael, Draine, Bruce T., Hollenbach, David J., editor, and Thronson, Harley A., Jr., editor

Laud, Purushottam, Saunders, Roy, Taillie, Charles, editor, Patil, Ganapati P., editor, and Baldessari, Bruno A., editor

Pagel, B. E. J., Audouze, Jean, editor, and Tran Thanh Van, Jean, editor

Haglind, E., Dawidsson, I., Lund, N., Appelgren, L., Gelin, L.-E., Silver, I. A., editor, Erecińska, M., editor, and Bicher, H. I., editor

Stock, W., Eigler, F. W., Sicuteri, F., editor, e Silva, M. Rocha, editor, and Back, Nathan, editor