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To understand the different mechanism occurring at the MoS2-silicon interface, we have fabricated a MoS2/Si heterojunction by exfoliating MoS2 on top of the silicon substrate. Raman spectroscopy and atomic force microscopy (AFM) measurement expose the signature of few-layers in the deposited MoS2 flake. Herein, the temperature dependence of the energy barrier and carrier density at the MoS2/Si heterojunction has been extensively investigated. Furthermore, to study band alignment at the MoS2/Si interface, we have calculated a valence band offset of 0.66 ± 0.17 eV and a conduction band offset of 0.42 ± 0.17 eV using X-ray and Ultraviolet photoelectron spectroscopy. We determined a type-II band alignment at the interface which is very conducive for the transport of photoexcited carriers. As a proof-of-concept application, we extend our analysis of the photovoltaic behavior of the MoS2/Si heterojunction. This work provides not only a comparative study between MoS2/p-Si and MoS2/n-Si heterojunctions but also paves the way to engineer the properties of the interface for the future integration of MoS2 with silicon. [ABSTRACT FROM AUTHOR]

We report the ultrafast carrier dynamics of an SnSe2–SnSe composite thin film (∼150 nm thick) deposited using thermal evaporation of in-house synthesized SnSe2 powder. Raman and UV–visible spectroscopy supports the optical properties (direct and indirect bandgaps of 1.86 eV and 0.96 eV, respectively). Ultrafast transient spectroscopy is used to study the charge excited state dynamics in the SnSe2–SnSe composite thin film in the femtosecond to nanosecond interval. An energy model has been proposed based on the ultrafast transient absorption and the thin film's steady-state absorption studies. This article provides comprehensive knowledge about the excited carriers and their relaxations in 0.9 ps–31.1 ns via different trap states. [ABSTRACT FROM AUTHOR]