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Automatic inspection of micro-defects of thin film transistor-liquid crystal display (TFT-LCD) panels is a critical task in LCD manufacturing. To meet the practical demand of online inspection of a one-dimensional (1D) line image captured by the line scan visual system, we propose a robust 1D Fourier reconstruction method with the capability of automatic determination of the period Δx of the periodic pattern of a spatial domain line image and the neighboring length r of the frequency peaks of the corresponding frequency domain line image. Moreover, to alleviate the difficulty in the discrimination between the defects and the non-uniform illumination background, we present an effective way to correct the non-uniform background using robust locally weighted smoothing combined with polynomial curve fitting. As a proof-of-concept, we built a line scan visual system and tested the captured line images. The results reveal that the proposed method is able to correct the non-uniform illumination background in a proper way that does not cause false alarms in defect inspection but also preserves complete information about the defects in terms of the brightness and darkness as well as the shape, indicating its distinct advantage in defect inspection of TFT-LCD panels. [ABSTRACT FROM AUTHOR]

Flexible energy storage based on ferroelectric capacitors enjoys high power density and rapid respond time, but the polarization fatigue problems limit its long-term reliability. Bi3.15Nd0.85Ti3O12 (BNT) is a lead-free ferroelectric material with fatigue-free properties, which is promising for applications in long-term ferroelectric devices. Nevertheless, the applications of BNT thin films for energy storage are restricted by their poor energy efficiency and low energy density. In this work, flexible BNT thin films with different numbers of SrTiO3 (STO) insert layers are fabricated on flexible mica substrates by an exquisitely designed dual-target pulsed laser deposition process, and the energy storage performances are effectively optimized via interface engineering. By inserting periodic STO dielectric layers with repetition periods of 100, the energy storage density (Wrec) and efficiency (η) are improved to ∼24.26 J cm−3 and ∼71.93%, which are, respectively, increased to 287% and 132% compared with the pure phase BNT thin film. Importantly, the improved Wrec and η can be well maintained under large bending deformation (bending radius as small as r = 4 mm) and within a wide temperature range (25–175 °C), suggesting its good stability and reliability. These results show that the involvement of periodic dielectric layers in BNT thin films can significantly enhance energy storage density and efficiency and effectively promote its applications in future flexible energy storage devices. [ABSTRACT FROM AUTHOR]