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In this paper, the results of detailed X-ray photoelectron spectroscopy (XPS) studies combined with atomic force microscopy (AFM) investigation concerning the local surface chemistry and morphology of nanostructured ZnO thin films are presented. They have been deposited by direct current (DC) reactive magnetron sputtering under variable absolute Ar/O2 flows (in sccm): 3:0.3; 8:0.8; 10:1; 15:1.5; 20:2, and 30:3, respectively. The XPS studies allowed us to obtain the information on: (1) the relative concentrations of main elements related to their surface nonstoichiometry; (2) the existence of undesired C surface contaminations; and (3) the various forms of surface bondings. It was found that only for the nanostructured ZnO thin films, deposited under extremely different conditions, i.e., for Ar/O2 flow ratio equal to 3:0.3 and 30:3 (in sccm), respectively, an evident and the most pronounced difference had been observed. The same was for the case of AFM experiments. What is crucial, our experiments allowed us to find the correlation mainly between the lowest level of C contaminations and the local surface morphology of nanostructured ZnO thin films obtained at the highest Ar/O2 ratio (30:3), for which the densely packaged (agglomerated) nanograins were observed, yielding a smaller surface area for undesired C adsorption. The obtained information can help in understanding the reason of still rather poor gas sensor characteristics of ZnO based nanostructures including the undesired ageing effect, being of a serious barrier for their potential application in the development of novel gas sensor devices. [ABSTRACT FROM AUTHOR]

This paper presents the results of studies of the local surface properties of pure and highly Nb-doped (12 wt %) TiO2 nanotubes (TNT) using the X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) methods, respectively. XPS analysis showed that the pure TNT exhibit an evident over-stoichiometry combined with high level of undesired C contaminations, which was confirmed by the relative concentration of specific elements O, Ti and C (with respect to all the surface atoms) equal to 0.46, 018 and 0.36, respectively. In turn, for the highly Nb-doped (12 wt %) TNT, a slightly different surface chemistry was observed because the relative concentration of specific elements O and Ti and, with respect to all the surface atoms, is slightly lower, that is, 0.42 and 0.12, respectively; this is directly related to the fact that Nb atoms appeared having the relative concentration at the level of 0.09, whereas the undesired C contaminations reached the same level (0.36), as is the case of pure TNT. In addition, SEM analysis confirms that there are evident free spaces between the specific slops containing several TNT, what was additionally confirmed by the contribution of specific surface bonding coming from the SiO2/Si substrate. The obtained information allowed us a new insight on the potential origin of aging effect at the surface of TNT in atmosphere being the undesired limitation for their potential application as the chemical resistive type sensors or in any other fields of their application related to their surface activity. [ABSTRACT FROM AUTHOR]