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The luminescence efficiency of AlxGa1−xN quantum dots (QDs) and quantum wells (QWs), buried in AlN cladding layers and emitting in the ultraviolet range between 234 and 310 nm, has been investigated. The growth and optical properties have been done using similar aluminum composition (varying from 0.4 to 0.75) for both QDs and QWs. In order to compare as much as possible the optical properties, the QWs were fabricated with a growth time tuned such that the QW width is similar to the average height of the QDs. The photoluminescence (PL) showed emission ranging from 4 to 5.4 eV, putting into evidence differences in terms of full width at half maximum, PL intensity, and asymmetry of the line shape between QDs and QWs. The results show shorter wavelengths and a slightly narrower PL linewidth for QWs. To determine the light emission dependence with the electric field direction in the crystal, the evolutions of the emission diagrams for all samples were recorded along two orthogonal directions, namely, the "in-plane" (growth) and the "on-side" directions, from which the light emission was collected. For the whole QDs and QWs samples' series, the shapes of the emission diagram indicate emission in both in-plane and on-side directions, as evidenced by intra-valence band mixings caused by strain effects combined with the anisotropic Coulomb interactions that are particularly contributing to the polarization at wavelengths below 260 nm. Furthermore, the degree of polarization, determined for each sample, showed good agreement with results from the literature. [ABSTRACT FROM AUTHOR]

Eco‐friendly and low‐cost aluminum gallium nitride (AlGaN) for the epitaxial growth of ultraviolet‐B (UVB) light‐emitting diodes (LEDs) on c‐Sapphire has the possibility of high external‐quantum efficiency (EQE). In this review paper a special growth techniques for 50% relaxed and 4 μm thick AlGaN buffer layer underneath the multi‐quantum wells (MQWs) are challenged to achieve a maximum internal‐quantum efficiency of 50–57% in 310–290 nm band UVB LEDs. The influence of a thin "Valley" layer in p‐type multi‐quantum barrier electron‐blocking layer on 2D hole generation and injection via intraband tunneling was attempted. Finally, the influence of soft polarized Mg‐doped p‐type Al‐graded AlGaN hole injection layer assisted by excimer laser annealing for better hole injection toward the MQWs was investigated and quite high hole concentration of 2 × 1016 cm−3 and resistivity of 24 Ω‐cm at room temperature was achieved. Consequently, the EQE of transparent 310 and 304 nm UVB LEDs, respectively, reached to a confirmed world record values of ≈5% and ≈10% with light powers of 29 and 40 mW on wafer. This EQE value can surpass 21% if flip‐chip, nanoPSS, photonic crystal, and lens with highly reflective p‐electrodes are incorporated in LED. [ABSTRACT FROM AUTHOR]

A significant enhancement in the output power of a GaAs-based terahertz quantum cascade laser (THz QCL) was achieved by implementing a relatively high impurity doping concentration. The QC structure was precisely designed using the nonequilibrium green function method by considering the band bending effect caused by a higher doping concentration. This enabled us to avoid the subband misalignment induced by the strong band bending effect, to provide efficient carrier transport even at high doping concentrations, and to improve the output power. The maximum output power of a GaAs/Al0.16Ga0.84As 3.5 THz-band QCL at 10 K was enhanced from 390 to 600 mW by increasing the doping concentration at the depopulation layers from 6 × 1016 to 1.2 × 1017 cm−3. The average power of 21 mW was achieved by implementing the appropriate pulse drive conditions. [ABSTRACT FROM AUTHOR]

For terahertz quantum cascade lasers employing the nonalignment injection scheme via direct-phonon resonance, this study presents the crucial effect of parasitic absorption in the narrow module architecture based on only two quantum wells. The optical gain can be restricted to small (or negative) values even at the low temperature. To address this issue, a suppression strategy by increasing the injection energy is used to isolate the relevant levels. The feasibility of this strategy is experimentally demonstrated by observing lasing at 194 K. [ABSTRACT FROM AUTHOR]

The correlation between the recombination dynamics of excitons and the internal quantum efficiency (IQE) of AlGaN-based UV-A multiple quantum wells (MQWs) was studied via photoluminescence (PL) and time-resolved PL (TRPL) spectroscopy. The probability ratio of the capture of excitons by nonradiative recombination centers (NRCs) and the radiative recombination of excitons was evaluated individually via two different experimental analyses. The IQE was evaluated via temperature- and excitation power density-dependent PL measurements and its dependence on excitation density was analyzed using a rate equation model based on the radiative and nonradiative recombination of excitons. Moreover, the radiative and nonradiative recombination lifetimes were evaluated via temperature-dependent TRPL measurements; furthermore, they were analyzed as functions of temperature and excitation energy density. The probability ratios obtained from the two individual analyses were in agreement. This quantitative agreement indicated that the analysis based on the radiative and nonradiative recombination processes of excitons, which included the process of filling NRCs, was valid for AlGaN-based UV-A MQWs. [ABSTRACT FROM AUTHOR]

The emission performance of c‐sapphire‐grown deep‐UV (DUV) light‐emitting diodes (LEDs) at 254 and 258 nm is particularly poor. To overcome this critical limitation, herein, the influence of the Mg‐dopant concentration in a p‐AlGaN hole source layer (HSL) on donor–acceptor pair emission from solid‐state AlGaN‐based DUV LEDs in the 254–258 nm band is investigated. Further, the influence of substrate growth temperature (TS) on the photoluminescence (PL) emission efficiency and external quantum efficiency (EQE) is investigated. When the TS is increased from 1140 to 1170 °C for a p‐AlGaN HSL with a low Mg‐dopant concentration (70 sccm), the maximum power outputs of the fabricated DUV LED at the single peak emissions of 254 and 258 nm are enhanced to 3.4 and 14 mW, respectively. Moreover, the maximum EQE of the 254 and 258 nm‐band DUV LEDs increases by ≈1.2% and 2.2%, respectively, on the wafer during both continuous‐wave and pulsed operation at room temperature. [ABSTRACT FROM AUTHOR]